RE: Nikon Acknowleges Banding, Sort Of

["gary" <gsellani@xxxxxxxxxxxxx>]

One easy way to get a flaky design is to use an op amp near the extremes of
it's gain bandwidth product. Most op amps leave the factory with only DC
testing. Typically the only way a product gets it's AC specs insured is via
transistor level product test of the test pattern, i.e. caps are in spec,
f-tau in spec,etc. People often wonder why you pay more for an op amp from
PMI (now AD) versus National. Well, one company really tests what leaves the
factory. The other will gladly refund your money for any part you find that
doesn't meet spec.

Most chips are not tested at cold except on a sample basis. If you are
lucky, you get 100% room temp and 100% hot test, though some chip only get
hot testing.

It is amazing anything works at all. ;-)



> -----Original Message-----
> From: owner-scan@leben.com [mailto:owner-scan@leben.com]On Behalf Of
> rafe.bustin@verizon.net
> Sent: Friday, April 12, 2002 12:31 PM
> To: scan@leben.com
> Subject: Re: Nikon Acknowleges Banding, Sort Of
>
>
> On 12 Apr 2002 at 15:41, dickbo wrote:
>
> > I would submit to you the idea that there is no such thing as an
> > intermittent "Design" problem in that the fault will not be found in the
> > design but somewhere else such as a single or machine batch
> component fault
> > or even a test procedure shortcoming.
> >
> > Of course it might just be a user failing, but God forbid the paying
> > customer could ever be at fault.
>
>

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